IDDQ Testing of VLSI Circuits W. Vogel & M. Büttner GmbH Veranstaltung: NDL

Veranstaltung: NDL

Most of the processes that occur in temperate environments turn out to be completely different in the tropics

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IDDQ Testing of VLSI Circuits W. Vogel & M. Büttner GmbH Veranstaltung: NDLPower supply current monitoring to detect CMOS IC defects during production testing quietly laid down its roots in the mid 1970s. Both Sandia Labs and RCA in the United States and Philips Labs in the Netherlands practiced this procedure on their CMOS ICs. At that time, this practice stemmed simply from an intuitive sense that CMOS ICs showing abnormal quiescent power supply current (I DDQ ) contained defects. Later, this intuition was supported by